Skip to main navigation Skip to main content
  • KIEEME

J Electr Electron Mater : Journal of Electrical and Electronic Materials

OPEN ACCESS
ABOUT
BROWSE ARTICLES
EDITORIAL POLICIES
FOR CONTRIBUTORS

Page Path

  • HOME
  • BROWSE ARTICLES
  • Previous issues
16
results for

Previous issues

Keywords

Previous issues

Prev issue Next issue

Volume 18(2); February 2005

  • 36 View
  • 0 Download
A Study of Oxygen Vacancy on SnO2 Thin Films
J Korean Inst Electr Electron Mater Eng 2005;18(2):109-115.   Published online February 1, 2005
DOI: https://doi.org/10.4313/JKEM.2005.18.2.109

Citations

Citations to this article as recorded by  
  • Structural and X-Ray Photoelectron Spectroscopy Study of Al-Doped Zinc-Oxide Thin Films
    Bong Ju Lee, Ho Jun Song, Jin Jeong
    Advances in Materials Science and Engineering.2015; 2015: 1.     CrossRef
  • Effect of the Change of Deposition Time on the Secondary Direction and Abnormal Shape of Grains Growth of SnO2Thin Films
    Jin Jeong
    Advances in Materials Science and Engineering.2015; 2015: 1.     CrossRef
  • 41 View
  • 0 Download
  • 2 Crossref
A Study on Properties of ZnO:Al Films on PC Substrate for Solar Cell Applications
J Korean Inst Electr Electron Mater Eng 2005;18(2):116-119.   Published online February 1, 2005
DOI: https://doi.org/10.4313/JKEM.2005.18.2.116

Citations

Citations to this article as recorded by  
  • Effects of Sputter Pressure on the Properties of Sputtered ZnO:AI Films Deposited on Plastic Substrate
    Jae Hyeong Lee
    Journal of Korean Institute of Electrical and Electronic Materials Engineers.2009; 22(3): 277.     CrossRef
  • 34 View
  • 0 Download
  • 1 Crossref
Characteristics of Mo Gate Electrode Deposited on ZrO2 Gate Insulator
J Korean Inst Electr Electron Mater Eng 2005;18(2):120-124.   Published online February 1, 2005
DOI: https://doi.org/10.4313/JKEM.2005.18.2.120
  • 36 View
  • 0 Download
  • 28 View
  • 0 Download
A Study on the Characteristics of Dual-band Plastic Chip Antenna for Mobile Terminal using the Foamex Materials
J Korean Inst Electr Electron Mater Eng 2005;18(2):130-135.   Published online February 1, 2005
DOI: https://doi.org/10.4313/JKEM.2005.18.2.130
  • 31 View
  • 0 Download
  • 30 View
  • 0 Download
  • 35 View
  • 0 Download
Hydrophilic Effect of the Polyimide by Atmospheric Low-temperature Plasma Treatment
J Korean Inst Electr Electron Mater Eng 2005;18(2):148-152.   Published online February 1, 2005
DOI: https://doi.org/10.4313/JKEM.2005.18.2.148
  • 27 View
  • 0 Download
A Study on Fault Diagnosis and Performance Evaluation of Propulsion Equipment
J Korean Inst Electr Electron Mater Eng 2005;18(2):153-158.   Published online February 1, 2005
DOI: https://doi.org/10.4313/JKEM.2005.18.2.153
  • 33 View
  • 0 Download
Characteristics of ZnO Thin Film for SMR-typed FBAR Fabrication
J Korean Inst Electr Electron Mater Eng 2005;18(2):159-163.   Published online February 1, 2005
DOI: https://doi.org/10.4313/JKEM.2005.18.2.159
  • 31 View
  • 0 Download
Characteristics of ZnO Thin Films of FBAR using ALD and RE Magnetron Sputtering
J Korean Inst Electr Electron Mater Eng 2005;18(2):164-168.   Published online February 1, 2005
DOI: https://doi.org/10.4313/JKEM.2005.18.2.164
  • 38 View
  • 0 Download
Formation of Ni Oxide Thin Film and Analysis of Its Characteristics for Thermal Sensors
J Korean Inst Electr Electron Mater Eng 2005;18(2):169-173.   Published online February 1, 2005
DOI: https://doi.org/10.4313/JKEM.2005.18.2.169
  • 34 View
  • 0 Download
Homogeneous Aligned a Single Gap Transflective Liquid Crystal Display Driven by Vertical Electric Field
J Korean Inst Electr Electron Mater Eng 2005;18(2):174-179.   Published online February 1, 2005
DOI: https://doi.org/10.4313/JKEM.2005.18.2.174
  • 28 View
  • 0 Download

Citations

Citations to this article as recorded by  
  • Hierarchical Causality in Financial Economics
    Diane Wilcox, Tim Gebbie
    SSRN Electronic Journal.2014;[Epub]     CrossRef
  • 38 View
  • 0 Download
  • 1 Crossref
Characteristics of ZnGa2O4 Phosphor Thin Film with Temperature of Substrate and Annealing
J Korean Inst Electr Electron Mater Eng 2005;18(2):187-191.   Published online February 1, 2005
DOI: https://doi.org/10.4313/JKEM.2005.18.2.187
  • 27 View
  • 0 Download