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Volume 15(6); June 2002

Argon and Nitrogen Implantation Effects on the Structural and Optical Properties of Vacuum Evaporated Cadmium Sulphide Thin Films
Jae Hyeong Lee, D. Mangalaraj, Jun Sin Yi
J Korean Inst Electr Electron Mater Eng 2002;15(6):471-478.   Published online June 1, 2002
DOI: https://doi.org/10.4313/JKEM.2002.15.6.471
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Effects of Wafer Cleaning and Heat Treatment in Glass / Silicon Wafer Direct Bonding
Hong Seok Min, Young Chang Joo, Oh Sung Song
J Korean Inst Electr Electron Mater Eng 2002;15(6):479-485.   Published online June 1, 2002
DOI: https://doi.org/10.4313/JKEM.2002.15.6.479

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  • Study on Low Temperature Bonding Technology for Optical PCB with Polymer Intermediate Layers
    Doo Yeol Cha, Jai Hyuk Lee, Sung Pil Chang
    Journal of Korean Institute of Electrical and Electronic Materials Engineers.2010; 23(1): 29.     CrossRef
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  • 1 Crossref
Ferroelectric Properties of Bi3.25La0.75Ti3O12 Thin Films Prepared by MOD
Kyoung Tae Kim, Chagn Il Kim, Ji Woon Kwon, Il Wun Shim
J Korean Inst Electr Electron Mater Eng 2002;15(6):486-491.   Published online June 1, 2002
DOI: https://doi.org/10.4313/JKEM.2002.15.6.486
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Design of Multi - layer VCO for 960 MHz Band
Dong Hee Rhie, Jin Hwee Jung
J Korean Inst Electr Electron Mater Eng 2002;15(6):492-498.   Published online June 1, 2002
DOI: https://doi.org/10.4313/JKEM.2002.15.6.492
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Electrical Characteristics of Piezoelectric Transformer Composition Pb(Sb1/2 Nb1/2)O3-Pb(Ni1/3 Nb2/3)O3-Pb(Zr,Ti)O3 Ceramics for Adaptor
Kwang Hee Yoon, Dong On Oh, Ju Hyun Yoo, Hyung Sang Yoon
J Korean Inst Electr Electron Mater Eng 2002;15(6):499-503.   Published online June 1, 2002
DOI: https://doi.org/10.4313/JKEM.2002.15.6.499
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The Surface and Electrical Properties of BST Thin Films Prepared by Sol - Gel Method
Kyung Jin Hong, Jae Cheol Cho
J Korean Inst Electr Electron Mater Eng 2002;15(6):504-510.   Published online June 1, 2002
DOI: https://doi.org/10.4313/JKEM.2002.15.6.504
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Sensor , Thin Film : Electrochemical Properties of Diiron Complexes with Conjugated Chains
Micheal B. Sponsler, Min Chul Chung
J Korean Inst Electr Electron Mater Eng 2002;15(6):511-517.   Published online June 1, 2002
DOI: https://doi.org/10.4313/JKEM.2002.15.6.511
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Sensor , Thin Film : The Electrical Characteristics of Chromium Oxide Film Produced by lon Beam Sputter Deposition
Nam Je Cho, Kyu Yong Lee
J Korean Inst Electr Electron Mater Eng 2002;15(6):518-523.   Published online June 1, 2002
DOI: https://doi.org/10.4313/JKEM.2002.15.6.518
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Display , Optical Devices : Electro - optic Characteristics of Hybrid Aligned Nematic Liquid Crystal Display Driven by Fringe Field
Y. H. Jeong, H. Y. Kim, S. H. Lee
J Korean Inst Electr Electron Mater Eng 2002;15(6):524-528.   Published online June 1, 2002
DOI: https://doi.org/10.4313/JKEM.2002.15.6.524
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Display , Optical Devices : An Analysis of the Distortions of High Speed Pulse Signal on the Microstrip Lines of the Single and Coupled Structures
Gi Rae Kim
J Korean Inst Electr Electron Mater Eng 2002;15(6):529-534.   Published online June 1, 2002
DOI: https://doi.org/10.4313/JKEM.2002.15.6.529
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Magnetic Suspension Effect of BiPbSrCaCuO Superconductor
Sang Heon Lee
J Korean Inst Electr Electron Mater Eng 2002;15(6):535-538.   Published online June 1, 2002
DOI: https://doi.org/10.4313/JKEM.2002.15.6.535
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Thickness and Orientation Effect on the YBCO Thin Films For Microwave Device Applications
Hee Sauk Jhon, Kyoung Bo Han, Chang Hoon Jeon, Sang Yeol Lee, Chang Hoi Hur
J Korean Inst Electr Electron Mater Eng 2002;15(6):539-542.   Published online June 1, 2002
DOI: https://doi.org/10.4313/JKEM.2002.15.6.539
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High Voltage Engineering : Effect of Mixed Gases on Decomposition Characteristic of CF4 by Non - Thermal Plasma
Jae Yoon Park, Jang Gun Jung, Jong Seck Kim, Kwang Soo Kim, Keun Hee Lim
J Korean Inst Electr Electron Mater Eng 2002;15(6):543-550.   Published online June 1, 2002
DOI: https://doi.org/10.4313/JKEM.2002.15.6.543
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High Voltage Engineering : Effect of a Laser Ablation on High Voltage Discharge Plasma Area for Carbon Nitride Film Deposition
Jong Il Kim
J Korean Inst Electr Electron Mater Eng 2002;15(6):551-557.   Published online June 1, 2002
DOI: https://doi.org/10.4313/JKEM.2002.15.6.551
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