Skip to main navigation
Skip to main content
KIEEME
mobile search button
mobile menu button
Search
Advanced Search
ABOUT
ABOUT
Journal introduction
Aims and scope
Editorial board
Management team
Best practice
Subscription information
Contact us
BROWSE ARTICLES
All issues
Current issue
Most viewed
Most downloaded
Most cited
Search
Metrics
EDITORIAL POLICIES
Research ethics
Peer review policy
Copyright and open access policy
Article sharing policy
Archiving policy
Data sharing policy
Preprint policy
Crossmark policy
Advertising and sponsorship policy
Research misconduct-related regulations
FOR CONTRIBUTORS
Instructions for authors
Checklist
Copyright transfer agreement
Graphical abstract
E-SUBMISSION
ABOUT
Journal introduction
Aims and scope
Editorial board
Management team
Best practice
Subscription information
Contact us
BROWSE ARTICLES
All issues
Current issue
Most viewed
Most downloaded
Most cited
Search
Metrics
EDITORIAL POLICIES
Research ethics
Peer review policy
Copyright and open access policy
Article sharing policy
Archiving policy
Data sharing policy
Preprint policy
Crossmark policy
Advertising and sponsorship policy
Research misconduct-related regulations
FOR CONTRIBUTORS
Instructions for authors
Checklist
Copyright transfer agreement
Graphical abstract
Page Path
HOME
Search
Charge-trap flash
WHERE t1.sid in(parameter_dbtbl_keyword '%Charge-trap flash%') and t1.xml_status <> 99
1
results for
"Charge-trap flash"
Filter
Keywords
Charge-trap flash (1)
Fast erase speed (1)
Low programming voltage (1)
NAND flash memory (1)
p-channel SONOS (1)
Publication year
2009 (1)
Authors
Byung Cheul Kim (1)
Joo Yeon Kim (1)
Keywords
Charge-trap flash (1)
Fast erase speed (1)
Low programming voltage (1)
NAND flash memory (1)
p-channel SONOS (1)
Cancel
Close
authors
Byung Cheul Kim (1)
Joo Yeon Kim (1)
Cancel
Close
Publication Year
2009 (1)
Cancel
Close
Funded articles
Cancel
Close
"Charge-trap flash"
The Characteristics of p-channel SONOS Transistor for the NAND Charge-trap Flash Memory
Byung Cheul Kim, Joo Yeon Kim
J Electr Electron Mater
2009;22(1):7-11.
Published online January 1, 2009
PDF
13
View
0
Download
First
Prev
Page
of 1
Next
Last
×
TOP
First
Prev
