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J Electr Electron Mater : Journal of Electrical and Electronic Materials

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"Common source Line"

Investigation for Multi-bit per Cell on the CSL-NOR Type SONOS Flash Memories
J Korean Inst Electr Electron Mater Eng 2005;18(3):193-198.   Published online March 1, 2005
DOI: https://doi.org/10.4313/JKEM.2005.18.3.193
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A Study on the High Integrated 1TC SONOS Flash Memory
Joo Yeon Kim, Byeong Chel Kim, Kwang Yell Seo
J Korean Inst Electr Electron Mater Eng 2003;16(5):372-377.   Published online May 1, 2003
DOI: https://doi.org/10.4313/JKEM.2003.16.5.372
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