Skip to main navigation Skip to main content
  • KIEEME

J Electr Electron Mater : Journal of Electrical and Electronic Materials

OPEN ACCESS
ABOUT
BROWSE ARTICLES
EDITORIAL POLICIES
FOR CONTRIBUTORS

Page Path

1
results for

"Delta-doping"

Keywords

Publication year

"Delta-doping"

Low-frequency Noise Characteristics of Si0.8Ge0.2 pMOSFET Depending upon Channel Structures and Bias Conditions
J Electr Electron Mater 2006;19(1):1-6.   Published online January 1, 2006
  • 7 View
  • 0 Download