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"ITO film"

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"ITO film"

Effect on the Thermal Treatment for Improving Efficiency in Silicon Heterojunction Solar Cells
Hyeong Gi Park, Junsin Yi
J Korean Inst Electr Electron Mater Eng 2024;37(4):439-444.   Published online July 1, 2024
DOI: https://doi.org/10.4313/JKEM.2024.37.4.12
This study investigates the post-thermal treatment effects on the efficiency of silicon heterojunction solar cells, specifically examining the influence of annealing on p-type microcrystalline silicon oxide and ITO thin films. By assessing changes in carrier concentration, mobility, resistivity, transmittance, and optical bandgap, we identified conditions that optimize these properties. Results reveal that appropriate annealing significantly enhances the fill factor and current density, leading to a notable improvement in overall solar cell efficiency. This research advances our understanding of thermal processing in siliconbased photovoltaics and provides valuable insights into the optimization of production techniques to maximize the performance of solar cells.

Citations

Citations to this article as recorded by  
  • A Review on Energy Yield Enhancement Characteristics of Bifacial Photovoltaic Systems Combined with Solar Tracking
    Hyeong Gi Park
    Journal of Electrical and Electronic Materials.2026; 39(4): 309.     CrossRef
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  • 2 Download
  • 1 Crossref
Effects of Heat Treatment on the Properties of ITO Films Deposited with Powder Target
J Korean Inst Electr Electron Mater Eng 2006;19(2):109-115.   Published online February 1, 2006
DOI: https://doi.org/10.4313/JKEM.2006.19.2.109
  • 79 View
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Study on Electrical Characteristics of Plastic ITO Film with Bending on Multi-barrier Films
Jun Baeg Park, Jeong Yeon Hwang, Dae Sig Seo, Dae Gyu Mun, Jeong In Han
J Korean Inst Electr Electron Mater Eng 2004;17(1):70-74.   Published online January 1, 2004
DOI: https://doi.org/10.4313/JKEM.2004.17.1.070
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Display : The Stress Distribution of Indium-tin-oxide (ITO) Film on Flexible Display Substrate by Bending
Jun Baeg Park, Jeong Yeon Hwang, Dae Sig Seo, Seong Gyu Park, Dae Gyu Mun, Jeong In Han
J Korean Inst Electr Electron Mater Eng 2003;16(12):1115-1120.   Published online December 1, 2003
DOI: https://doi.org/10.4313/JKEM.2003.16.12.1115
  • 82 View
  • 0 Download