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Index of refraction
WHERE t1.sid in(parameter_dbtbl_keyword '%Index of refraction%') and t1.xml_status <> 99
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Dielectric constant (1)
Ellipsometry (1)
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2008 (1)
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Chang Su Hwang (1)
Hong Bae Kim (1)
In Hwan Yi (1)
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"Index of refraction"
A Study of the Dielectric Characteristics of the Low-k SiOCH Thin Films by Ellipsometry
In Hwan Yi, Chang Su Hwang, Hong Bae Kim
J Electr Electron Mater
2008;21(12):1083-1089.
Published online December 1, 2008
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