In this study, The RF magnetron sputter and evaporator was on glass substrates 30 mm × 30 mm OMO multilayer thin film structure is applied to the low-e. Structural and optical properties, a thin film was produced, the variable was placed into a variable deposition time of the oxide layer. According to the XRD measurement results there is no peak that satisfies the Bragg`s law (2dsinθ= nλ) which confirmed that it is an amorphous structure. RMS value of the results of the AFM measurement, has a roughness of less than 2 nm. transmittance measurements results, visible light region an average 80%, IR region 40% showed.

Citations

• Influence on the Structure and Optical Properties of Ni-Nb Thin Films Based on Thickness
  恒煕 崔
  Modern Physics.2018; 08(04): 198.     CrossRef
• Comparison of the Properties of Almotriptan PVA Hydrogel Depending on the Ratio of PEG and Confirmation of Potential as Transdermal Formulation
  Se Mi Kang, Young Jin Jung, Jae Ho Lee
  Journal of Life Science.2014; 24(4): 437.     CrossRef