Skip to main navigation Skip to main content
  • KIEEME

J Electr Electron Mater : Journal of Electrical and Electronic Materials

OPEN ACCESS
ABOUT
BROWSE ARTICLES
EDITORIAL POLICIES
FOR CONTRIBUTORS

Page Path

1
results for

"M/NEMS"

Keywords

Publication year

"M/NEMS"

Raman Scattering Characteristics on 3C-SiC Thin Films Deposited by APCVD Method
J Korean Inst Electr Electron Mater Eng 2007;20(7):606-610.   Published online July 1, 2007
DOI: https://doi.org/10.4313/JKEM.2007.20.7.606
  • 72 View
  • 0 Download