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"Magnetization"

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"Magnetization"

Comparative Analysis on Magnetization Characteristics and Stored Energy of Magnetically Coupled SFCLs Using Single and Double HTSC Elements
Sang-jae Choi, Bo-hee Kim, Sung-hun Lim
J Korean Inst Electr Electron Mater Eng 2017;30(2):101-105.   Published online February 1, 2017
DOI: https://doi.org/10.4313/JKEM.2017.30.2.101
In this paper, the magnetization characteristics and the stored energy of magnetically coupled superconducting fault current limiter (SFCL)s using single and double high-Tc superconducting (HTSC) elements were compared. To analyze the magnetization characteristics and the stored energy, the magnetizing current and the flux linkage, which were derived from the electrical equivalent circuit of the SFCL using single and double HTSC elements, were calculated from the voltages and the current measured in the short-circuit tests. Through the comparative analysis on the magnetization characteristics and the stored energy for SFCL using sing and double HTSC elements, the magnetically coupled SFCL using double HTSC elements was shown to be more effective than the SFCL using single HTSC element from the point of view of the magnetic saturation.
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Characteristic Analysis of a Flux-Lock Type SFCL Considering Magnetization Characteristic of Iron Core
J Korean Inst Electr Electron Mater Eng 2007;20(11):995-999.   Published online November 1, 2007
DOI: https://doi.org/10.4313/JKEM.2007.20.11.995
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Origin of the Initial Permeabiliy of Ni0.8-xZn0.2Fe2O4+δ Ferrite
Yong Un An, Jong Lyeong Kim, Yeong U O
J Korean Inst Electr Electron Mater Eng 2004;17(1):46-51.   Published online January 1, 2004
DOI: https://doi.org/10.4313/JKEM.2004.17.1.046
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A Study on the Effects of Small Amount of Eu Impurities in α-Fe2O3
Chang Heon Oh
J Korean Inst Electr Electron Mater Eng 2003;16(6):532-537.   Published online June 1, 2003
DOI: https://doi.org/10.4313/JKEM.2003.16.6.532
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Effect of Field Orientation on Magnetization Loss in a Stacked Bi-2223 Conductor
Kyung Woo Ryu, Kim Hyun Jun
J Korean Inst Electr Electron Mater Eng 2003;16(1):77-82.   Published online January 1, 2003
DOI: https://doi.org/10.4313/JKEM.2003.16.1.077
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