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"Metal guard ring"

Effect on Metal Guard Ring in Breakdown Characteristics of SiC Schottky Barrier Diode
J Korean Inst Electr Electron Mater Eng 2005;18(10):877-882.   Published online October 1, 2005
DOI: https://doi.org/10.4313/JKEM.2005.18.10.877

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  • Conduction Properties of Ni/Al Ohmic Contacts to Al-implanted p-type 4H-SiC
    Sung Jae Joo, Jae Yeol Song, In Ho Kang, Wook Bahng, Sang Cheol Kim, Nam Kyun Kim, Yong Jae Lee
    Journal of Korean Institute of Electrical and Electronic Materials Engineers.2009; 22(9): 717.     CrossRef
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