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Reflection coefficient
WHERE t1.sid in(parameter_dbtbl_keyword '%Reflection coefficient%') and t1.xml_status <> 99
4
results for
"Reflection coefficient"
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Keywords
Near-field scanning microwave microscope (3)
NSMM (3)
Reflection coefficient S11 (2)
Surface potential (2)
Copper(2) phthalocyanine thin film (1)
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2007 (2)
2005 (1)
2004 (1)
Authors
Arsen Babajayan (1)
Deok Joon Cha (1)
Kie Jin Lee (1)
Young San Lee (1)
Eun Ju Lim (1)
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Keywords
Near-field scanning microwave microscope (3)
NSMM (3)
Reflection coefficient S11 (2)
Surface potential (2)
Copper(2) phthalocyanine thin film (1)
Copper(2)-phthalocyanine thin film (1)
Interface between metal and organic material (1)
Interfacial electronic structrure (1)
Kelvin-probe method (1)
Natronomonas pharaonis (1)
Near-field microwave microscope (1)
NpSR 2 (1)
Organic pentacene (1)
Phase transition (1)
Reflection coefficient (1)
Reflection coefficient S(11) (1)
S(11) (1)
Scanning electron microscope (1)
Sensory rhodopsin 2 (1)
Space charge (1)
X-ray diffraction (1)
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authors
Arsen Babajayan (1)
Deok Joon Cha (1)
Kie Jin Lee (1)
Young San Lee (1)
Eun Ju Lim (1)
Mie Hwa Park (1)
Hyun Jun Yoo (1)
Soon Il Yun (1)
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2005 (1)
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"Reflection coefficient"
Optical Characterization of Sensory Rhodopsin 2 Thin Films using a Near-filed Scanning Microwave Microscope
J Korean Inst Electr Electron Mater Eng
2007;20(1):80-85.
Published online January 1, 2007
DOI:
https://doi.org/10.4313/JKEM.2007.20.1.080
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A Study on Space Charge of Organic Pentacene/metal Interface
Arsen Babajayan
J Korean Inst Electr Electron Mater Eng
2007;20(1):41-46.
Published online January 1, 2007
DOI:
https://doi.org/10.4313/JKEM.2007.20.1.041
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38
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1
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Study of Space Charge of Metal/copper(2)-phthalocyanine Interface
J Korean Inst Electr Electron Mater Eng
2005;18(4):350-356.
Published online April 1, 2005
DOI:
https://doi.org/10.4313/JKEM.2005.18.4.350
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34
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Study of Phase Transition of Copper(2)-phthalocyanine using a Near Field Scanning Microwave Microscope
Mie Hwa Park, Hyun Jun Yoo, Soon Il Yun, Eun Ju Lim, Kie Jin Lee, Deok Joon Cha, Young San Lee
J Korean Inst Electr Electron Mater Eng
2004;17(6):641-646.
Published online June 1, 2004
DOI:
https://doi.org/10.4313/JKEM.2004.17.6.641
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35
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