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Statistical design
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"Statistical design"
The Electrical Properties of Mutilayer Chip Capacitor with X7R by Addition of Rare-Earth Lons (Y2O3, Er2O3) using Design of Experiments
Jung Rag Yoon, Hwan Woon, Heun Young Lee
J Korean Inst Electr Electron Mater Eng
2010;23(3):216-221.
Published online March 1, 2010
DOI:
https://doi.org/10.4313/JKEM.2010.23.3.216
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