Skip to main navigation Skip to main content
  • KIEEME

J Electr Electron Mater : Journal of Electrical and Electronic Materials

OPEN ACCESS
ABOUT
BROWSE ARTICLES
EDITORIAL POLICIES
FOR CONTRIBUTORS

Articles

반도체 / 고집적 메모리의 yield 개선을 위한 전기적 구제회로

김필중, 김종빈

An Electrical Repair Circuit for Yield Increment of High Density Memory

Phil Jung Kim, Jong Bin Kim
J Electr Electron Mater 2000;13(4):273-279.
Published online: April 1, 2000
  • 4 Views
  • 0 Download
  • 0 Crossref
  • 0 Scopus
next

Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.

Format:

Include:

An Electrical Repair Circuit for Yield Increment of High Density Memory
J Electr Electron Mater. 2000;13(4):273-279.   Published online April 1, 2000
Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.

Format:
Include:
An Electrical Repair Circuit for Yield Increment of High Density Memory
J Electr Electron Mater. 2000;13(4):273-279.   Published online April 1, 2000
Close