Skip to main navigation Skip to main content
  • KIEEME

J Electr Electron Mater : Journal of Electrical and Electronic Materials

OPEN ACCESS
Search
Advanced Search
ABOUT
BROWSE ARTICLES
EDITORIAL POLICIES
FOR CONTRIBUTORS

Articles

Page Path

산소 플라즈마 처리후의 이차전자방출계수(γ)를 이용한 MgO 보호막의 일함수(Фw) 변화

정재천, 유세기, 조재원

Work Function Changes on MgO Protective Layer after O2-plasma Treatment from Ion-induced Secondary Electron Emission Coefficient

, ,
J Electr Electron Mater 2005;18(3):259-263.
Published online: March 1, 2005
  • 6 Views
  • 0 Download
  • 0 Crossref
  • 0 Scopus
prev next

Full Article

Download PDF Download PDF

Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.

Format:

Include:

Work Function Changes on MgO Protective Layer after O2-plasma Treatment from Ion-induced Secondary Electron Emission Coefficient
J Electr Electron Mater. 2005;18(3):259-263.   Published online March 1, 2005
Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.
Format:
Include:
Work Function Changes on MgO Protective Layer after O2-plasma Treatment from Ion-induced Secondary Electron Emission Coefficient
J Electr Electron Mater. 2005;18(3):259-263.   Published online March 1, 2005
Close

ABOUT

BROWSE ARTICLES

EDITORIAL POLICIES

FOR CONTRIBUTORS

© The Korean Institute of Electrical and Electronic Materials Engineers.