Skip to main navigation Skip to main content
  • KIEEME

J Electr Electron Mater : Journal of Electrical and Electronic Materials

OPEN ACCESS
Search
Advanced Search
ABOUT
BROWSE ARTICLES
EDITORIAL POLICIES
FOR CONTRIBUTORS

Articles

Page Path

Fringe-Field Switching (FFS) 모드에서 잔상 정량화에 관한 연구

신승민, 김미숙, 정연학, 김향율, 김서윤

Study on the Quantitativity of Image Sticking in the Fringe-Field Switching (FFS) Mode

, , , ,
J Korean Inst Electr Electron Mater Eng 2005;18(8):720-723.
Published online: August 1, 2005
  • 34 Views
  • 0 Download
  • 0 Crossref
  • 0 Scopus
prev next

Full Article

Download PDF Download PDF

Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.

Format:

Include:

Study on the Quantitativity of Image Sticking in the Fringe-Field Switching (FFS) Mode
J Korean Inst Electr Electron Mater Eng. 2005;18(8):720-723.   Published online August 1, 2005
DOI: https://doi.org/10.4313/JKEM.2005.18.8.720
Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.
Format:
Include:
Study on the Quantitativity of Image Sticking in the Fringe-Field Switching (FFS) Mode
J Korean Inst Electr Electron Mater Eng. 2005;18(8):720-723.   Published online August 1, 2005
DOI: https://doi.org/10.4313/JKEM.2005.18.8.720
Close

Related articles

ABOUT

BROWSE ARTICLES

EDITORIAL POLICIES

FOR CONTRIBUTORS

© The Korean Institute of Electrical and Electronic Materials Engineers.