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Thickness Dependence of the Electrical Properties in NiCr Thin Film Resistors Annealed in a Vacuum Ambient for π- type Attenuator Applications

Won Jae Lee, Soon Gil Yoon, Nguyen Mai Phuong
J Korean Inst Electr Electron Mater Eng 2006;19(8):712-716.
Published online: August 1, 2006
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Thickness Dependence of the Electrical Properties in NiCr Thin Film Resistors Annealed in a Vacuum Ambient for π- type Attenuator Applications
J Korean Inst Electr Electron Mater Eng. 2006;19(8):712-716.   Published online August 1, 2006
DOI: https://doi.org/10.4313/JKEM.2006.19.8.712
Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.
Format:
Include:
Thickness Dependence of the Electrical Properties in NiCr Thin Film Resistors Annealed in a Vacuum Ambient for π- type Attenuator Applications
J Korean Inst Electr Electron Mater Eng. 2006;19(8):712-716.   Published online August 1, 2006
DOI: https://doi.org/10.4313/JKEM.2006.19.8.712
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