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분포 통계 해석에 의한 계면 결함 부분방전 진단

조경순, 이강원, 김원종, 홍진웅, 신종열

Partial Discharge Diagnosis of Interface Defect by the Distribution Statistical Analysis

Kyung Soon Cho, Kang Won Lee, Won Jong Kim, Jin Woong Hong, Jong Yeol Shin
J Korean Inst Electr Electron Mater Eng 2008;21(4):348-353.
Published online: April 1, 2008
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Partial Discharge Diagnosis of Interface Defect by the Distribution Statistical Analysis
J Korean Inst Electr Electron Mater Eng. 2008;21(4):348-353.   Published online April 1, 2008
DOI: https://doi.org/10.4313/JKEM.2008.21.4.348
Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.
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Partial Discharge Diagnosis of Interface Defect by the Distribution Statistical Analysis
J Korean Inst Electr Electron Mater Eng. 2008;21(4):348-353.   Published online April 1, 2008
DOI: https://doi.org/10.4313/JKEM.2008.21.4.348
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