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J Electr Electron Mater : Journal of Electrical and Electronic Materials

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Post-CMP Cleaning에서 PVA 브러시 오염이 세정 효율에 미치는 영향

조한철, 유민종, 김석주, 정해도

Effect of PVA Brush Contamination on Post-CMP Cleaning Performance

Han Chul Cho, Min Jong Yuh, Suk Joo Kim, Hae Do Jeong
J Electr Electron Mater 2009;22(2):114-118.
Published online: February 1, 2009
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Effect of PVA Brush Contamination on Post-CMP Cleaning Performance
J Electr Electron Mater. 2009;22(2):114-118.   Published online February 1, 2009
Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.

Format:
Include:
Effect of PVA Brush Contamination on Post-CMP Cleaning Performance
J Electr Electron Mater. 2009;22(2):114-118.   Published online February 1, 2009
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