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J Electr Electron Mater : Journal of Electrical and Electronic Materials

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두께와 직경 비에 따른 두께진동모드 압전소자의 공진 변위 궤적

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Trajectory of Resonant Displacement of Thickness Vibration Mode Piezoelectric Devices According to Diameter/Thickness Ratio

Yeong Ho Jeong
J Electr Electron Mater 2012;25(2):105-109.
Published online: February 1, 2012
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In this study, thickness vibration mode piezoelectric devices for AE sensor application were simulated using ATILA FEM program, and then fabricated. Trajectory resonant displacement and electro mechanical coupling factors of the piezoelectric devices were investigated. The simulation results showed that excellent displacement and electro mechanical coupling factor was obtained when the ratio of diameter/thickness(Ф/T) was 0.75. The piezoelectric device of Ф/T=0.75 exhibited the optimum values of fr=183 kHz, displacement=4.44×10(-7)[m], k33=0.69, which were suitable for the application of AE sensor piezoelectric device.

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Trajectory of Resonant Displacement of Thickness Vibration Mode Piezoelectric Devices According to Diameter/Thickness Ratio
J Electr Electron Mater. 2012;25(2):105-109.   Published online February 1, 2012
Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.

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Trajectory of Resonant Displacement of Thickness Vibration Mode Piezoelectric Devices According to Diameter/Thickness Ratio
J Electr Electron Mater. 2012;25(2):105-109.   Published online February 1, 2012
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