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이층 박막 구조에서 ITO 전극의 레이저 직접 패터닝 시 레이저 식각 패턴 중첩 비율의 변화

왕건훈, 박정철, 권상직, 조의식

Overlapping Rates of Laser Spots on the Laser Direct Patterning of ITO Electrode in the Double-Layer Structure of Thin Film

Jian Xun Wang, Jung Cheul Park, Sang Jik Kwon, Eou Sik Cho
J Electr Electron Mater 2012;25(5):377-380.
Published online: May 1, 2012
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Laser direct patterning of indium tin oxide(ITO) is one of new methods of direct etching process to replace the conventional photolithography. A diode pumped Q-switched Nd:YVO4 (λ= 1,064 nm) laser was used to produce ITO electrode on various transparent oxide semiconductor films such as zinc oxide(ZnO). The laser direct etched ITO patterns on ZnO were compared with those on glass substrate and were considered in terms of the overlapping rate of laser beam. In case of the laser etching on double-layer, it was possible to obtain the higher overlapping rate of laser beam.

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Overlapping Rates of Laser Spots on the Laser Direct Patterning of ITO Electrode in the Double-Layer Structure of Thin Film
J Electr Electron Mater. 2012;25(5):377-380.   Published online May 1, 2012
Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.

Format:
Include:
Overlapping Rates of Laser Spots on the Laser Direct Patterning of ITO Electrode in the Double-Layer Structure of Thin Film
J Electr Electron Mater. 2012;25(5):377-380.   Published online May 1, 2012
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