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절연재료 : 건조일수에 따른 CSPE의 특성에 미치는 담수침지의 영향

강명균, 이정훈, 이승훈, 전준수, 박영, 박기엽, 정규원, 신용덕

Insulation Materials : Regular Paper ; Effects of Freshwater Flooding on Properties of CSPE with Number of Dried-Days

Myeong Kyun Kang, Jung Hoon Lee, Seung Hoon Lee, Jun Soo Jeon, Young Park, Ki Yub Park, Kyu Won Jeong, Yong Deok Shin
J Electr Electron Mater 2013;26(8):597-601.
Published online: August 1, 2013
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The accelerated thermal aging of a CSPE were carried out for 0, 80.82, 161.63 days at 100℃, which are equal to 0, 40 and 80 years of aging at 50℃, respectively. The volume electrical resistivities of the seawater and freshwater flooding were measured through 3-terminal circuit diagram. The volume electrical resistivities of the 0y, 40y and 80y were 2.454×1013∼1.377×1014Ω?cm, 1.121×1013∼7.529×1013Ω?cm and 1.284×1013∼8.974×1013Ω?cm at room temperature, respectively. The dielectric constant of the 0y, 40y and 80y were 2.922∼3.431, 2.613∼3.285 and 2.921∼3.332 at room temperature, respectively. It is certain that the ionic (Na+, Cl-, Mg2+, SO4 2-, Ca2+, K+) conduction current was formed by the salinity of the seawater. The volume electrical resistivity of the cleaned CSPE via freshwater trends slightly upward with the number of dried days at room temperature. As a result, the CH2 component of thermally accelerated aged CSPE decreased after seawater and freshwater flooding for 5 days respectively, whereas the atoms such as Cl, O, Pb, Al, Si, Sb, S related with the conducting ion (Na+, Cl-, Mg2+, SO4 2-, Ca2+, K+) component increased relatively.

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Insulation Materials : Regular Paper ; Effects of Freshwater Flooding on Properties of CSPE with Number of Dried-Days
J Electr Electron Mater. 2013;26(8):597-601.   Published online August 1, 2013
Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.

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Insulation Materials : Regular Paper ; Effects of Freshwater Flooding on Properties of CSPE with Number of Dried-Days
J Electr Electron Mater. 2013;26(8):597-601.   Published online August 1, 2013
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