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J Electr Electron Mater : Journal of Electrical and Electronic Materials

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3.3 kV 이상의 전력반도체 소자 구현 및 신뢰성 향상을 위한 필드링 최적 설계에 관한 연구

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The Optimal Design of Field Ring for Reliability and Realization of 3.3 kV Power Devices

Ey Goo Kang
J Electr Electron Mater 2017;30(3):148-151.
Published online: March 1, 2017
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This research concerns field rings for 3.3kV planar gate power insulated-gate bipolar transistors (IGBTs). We design an optimal field ring for a 3.3kV power IGBT and analyze its electrical characteristics according to field ring parameters. Based on this background, we obtained 3.3kV high breakdown voltage and a 2.9V on state voltage drop. To obtain high breakdown voltage, we confirmed that the field ring count was 23, and we obtained optimal parameters. The gap distance between field rings 13㎛ and the field ring width was 5㎛. This design technology will be adapted to field stop IGBTs and super junction IGBTs. The thyristor device for a power conversion switch will be replaced with a super high voltage power IGBT.

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The Optimal Design of Field Ring for Reliability and Realization of 3.3 kV Power Devices
J Electr Electron Mater. 2017;30(3):148-151.   Published online March 1, 2017
Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.

Format:
Include:
The Optimal Design of Field Ring for Reliability and Realization of 3.3 kV Power Devices
J Electr Electron Mater. 2017;30(3):148-151.   Published online March 1, 2017
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