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J Electr Electron Mater : Journal of Electrical and Electronic Materials

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다파장 IR과 NIR 모듈의 평균 수명 예측에 관한 연구

김동표, 김경섭

Study on the MTTF of Multi Wave Lengths IR and NIR LEDs Module

Dong Pyo Kim, Kyung Seob Kim
J Electr Electron Mater 2021;34(1):44-49.
Published online: January 1, 2021
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Recently, infrared (IR) and near-infrared (NIR) light-emitting diodes (LEDs) were widely used for home medical applications owing to its low output power and wide exposed area for curing. For deep penetration of the light under the skin, multiple LEDs with wavelengths of 700~10,000 nm were located on a flexible printed circuit board. When multiple wavelengths of LEDs were soldered on a circuit board, the lifetime of LED module highly depends on LEDs with a short lifetime. The mean time to failure (MTTF) was able to calculate with the experimental results under high temperature and the Arrhenius model. The results of this study could help companies to approve the warranty of LED modules and its product.

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Study on the MTTF of Multi Wave Lengths IR and NIR LEDs Module
J Electr Electron Mater. 2021;34(1):44-49.   Published online January 1, 2021
Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.

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Study on the MTTF of Multi Wave Lengths IR and NIR LEDs Module
J Electr Electron Mater. 2021;34(1):44-49.   Published online January 1, 2021
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