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J Electr Electron Mater : Journal of Electrical and Electronic Materials

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주사형 마이크로프로브 현미경과 나노테크놀로지

장상목, H. Mueamatsu, 권영수

Nanotechnology and Scanning Microprobe Microscopy

Sang Mok Jang, H . Muramatsu, Young Soo Kwon
J Electr Electron Mater 1996;9(6):616-624.
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Nanotechnology and Scanning Microprobe Microscopy
J Electr Electron Mater. 1996;9(6):616-624.
Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.

Format:
Include:
Nanotechnology and Scanning Microprobe Microscopy
J Electr Electron Mater. 1996;9(6):616-624.
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