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탄소의 원료로 일산화탄소를 사용한 다이아몬드 박막 성장 관찰에 대한 분광 Ellipsometry의 응용

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The Spectroscopic Ellipsometry Application to the Diamond Thin Film Growth Using Carbon Monoxide(CO) as a Carbon Source

Byung you Hong
J Korean Inst Electr Electron Mater Eng 1998;11(5):371-377.
Published online: May 1, 1998
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The Spectroscopic Ellipsometry Application to the Diamond Thin Film Growth Using Carbon Monoxide(CO) as a Carbon Source
J Korean Inst Electr Electron Mater Eng. 1998;11(5):371-377.   Published online May 1, 1998
Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.

Format:
Include:
The Spectroscopic Ellipsometry Application to the Diamond Thin Film Growth Using Carbon Monoxide(CO) as a Carbon Source
J Korean Inst Electr Electron Mater Eng. 1998;11(5):371-377.   Published online May 1, 1998
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