Skip to main navigation Skip to main content
  • KIEEME

J Electr Electron Mater : Journal of Electrical and Electronic Materials

OPEN ACCESS
Search
Advanced Search
ABOUT
BROWSE ARTICLES
EDITORIAL POLICIES
FOR CONTRIBUTORS

Articles

Page Path

간섭방법을 이용한 비정질 As40Ge10S35Se15 박막에서의 광유기 이방성 크기 측정

전진영, 박수호, 이현용, 정홍배

Estimation of the Anisotropy Magnitude in Amorphous As40Ge10S35Se15 Thin Films by an Interference Method

Jin Young Chun, Soo Ho Park, Hyun Yong Lee, Hong Bay Chung
J Electr Electron Mater 1998;11(9):746-751.
Published online: September 1, 1998
  • 4 Views
  • 0 Download
  • 0 Crossref
  • 0 Scopus
prev next

Full Article

Download PDF Download PDF

Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.

Format:

Include:

Estimation of the Anisotropy Magnitude in Amorphous As40Ge10S35Se15 Thin Films by an Interference Method
J Electr Electron Mater. 1998;11(9):746-751.   Published online September 1, 1998
Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.
Format:
Include:
Estimation of the Anisotropy Magnitude in Amorphous As40Ge10S35Se15 Thin Films by an Interference Method
J Electr Electron Mater. 1998;11(9):746-751.   Published online September 1, 1998
Close

Related articles

ABOUT

BROWSE ARTICLES

EDITORIAL POLICIES

FOR CONTRIBUTORS

© The Korean Institute of Electrical and Electronic Materials Engineers.