Degradation Diagnosis by Void Defects Using a Neural Network

Jae Kwan Choi; Sung Hong Kim; Jae Hwan Kim

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신경망을 이용한 보이드 결함에 의한 열화진단

최재관, 김성홍, 김재환

Degradation Diagnosis by Void Defects Using a Neural Network

Jae Kwan Choi, Sung Hong Kim, Jae Hwan Kim

J Electr Electron Mater 1998;11(10):940-946.
Published online: October 1, 1998

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Degradation Diagnosis by Void Defects Using a Neural Network

J Electr Electron Mater. 1998;11(10):940-946. Published online October 1, 1998

Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.

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bib — For JabRef, BibDesk, and other BibTeX-specific software

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Citation and abstract for the content below

Degradation Diagnosis by Void Defects Using a Neural Network

J Electr Electron Mater. 1998;11(10):940-946. Published online October 1, 1998

Articles

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신경망을 이용한 보이드 결함에 의한 열화진단

Degradation Diagnosis by Void Defects Using a Neural Network

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