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최재관, 김성홍, 김재환

Degradation Diagnosis by Void Defects Using a Neural Network

Jae Kwan Choi, Sung Hong Kim, Jae Hwan Kim
J Korean Inst Electr Electron Mater Eng 1998;11(10):940-946.
Published online: October 1, 1998
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Degradation Diagnosis by Void Defects Using a Neural Network
J Korean Inst Electr Electron Mater Eng. 1998;11(10):940-946.   Published online October 1, 1998
Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.

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Degradation Diagnosis by Void Defects Using a Neural Network
J Korean Inst Electr Electron Mater Eng. 1998;11(10):940-946.   Published online October 1, 1998
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