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Volume 21(2); February 2008

Effect of Temperature on Polishing Properties in Oxide CMP: Young Jin Kim, Boum Young Park, Hyoung Jae Kim, Hae Do Jeong; J Korean Inst Electr Electron Mater Eng 2008;21(2):93-98. Published online February 1, 2008; DOI: https://doi.org/10.4313/JKEM.2008.21.2.093

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Surface Reflectance Reduction of Multicrystalline Silicon Wafers for Solar Cells by Acid Texturing: Ji Sun Kim, Bum Ho Kim, Soo Hong Lee; J Korean Inst Electr Electron Mater Eng 2008;21(2):99-103. Published online February 1, 2008; DOI: https://doi.org/10.4313/JKEM.2008.21.2.099

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Design and Analysis of 16 V N-TYPE MOSFET Transistor for the Output Resistance Improvement at Low Gate Bias: Young Mok Kim, Han Sin Lee, Man Young Sung; J Korean Inst Electr Electron Mater Eng 2008;21(2):104-110. Published online February 1, 2008; DOI: https://doi.org/10.4313/JKEM.2008.21.2.104

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The Characteristic Variation of Mask with Plasma Treatment: Jwa Yeon Kim, Sang Su Choi, Byung Sun Kang, Dong Soo Min, Young Jin An; J Korean Inst Electr Electron Mater Eng 2008;21(2):111-117. Published online February 1, 2008; DOI: https://doi.org/10.4313/JKEM.2008.21.2.111

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Encapsulation of Fullerenes in Single-walled Carbon Nanotubes and their Characteristic Analysis by Raman Spectroscopy: Jeung Choon Goak, Nae Sung Lee; J Korean Inst Electr Electron Mater Eng 2008;21(2):118-125. Published online February 1, 2008; DOI: https://doi.org/10.4313/JKEM.2008.21.2.118

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Dielectric and Piezoelectric Characteristics of Low Temperature Sintering 0.20Pb(Zn1/3Nb2/3)O3-0.80Pb(Zr0.48Ti0.52)O3 Ceramics with the Addition of Sintering Aid ZnO: Ju Hyun Yoo, Yu Hyong Lee, Do Hyung Kim, Il Ha Lee, Jun Sik Kwon, Dong Soo Paik; J Korean Inst Electr Electron Mater Eng 2008;21(2):126-130. Published online February 1, 2008; DOI: https://doi.org/10.4313/JKEM.2008.21.2.126

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Multi-directionally Movable Lambda Shape Transducer for Ultrasonic Motor: Young Soo Do, Hyo Duk Nam, Young Duk Kim; J Korean Inst Electr Electron Mater Eng 2008;21(2):131-136. Published online February 1, 2008; DOI: https://doi.org/10.4313/JKEM.2008.21.2.131

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Dielectric Breakdown Voltage and Dielectric Properties of High Voltage Mutilayer Ceramic Capacitor with C0G Temperature Coefficient Characteristics: Jung Rag Yoon, Byong Chul Woo, Tae Serk Chung; J Korean Inst Electr Electron Mater Eng 2008;21(2):137-143. Published online February 1, 2008; DOI: https://doi.org/10.4313/JKEM.2008.21.2.137

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Effect of Tm2O3addition on dielectric property of barium titanate ceramics for MLCCs
Jin-Seong Kim, Hee-Soo Lee, Do-Won Kang, Jeong-Wook Kim
Journal of the Korean Crystal Growth and Crystal Technology.2010; 20(1): 25. CrossRef

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Sintering and Dielectric Properties in Cordierite/Glass Composite for LTCC Application: Il Sun Hwang, Dong Hun Yeo, Hyo Soon Shin, Jong Hee Kim; J Korean Inst Electr Electron Mater Eng 2008;21(2):144-150. Published online February 1, 2008; DOI: https://doi.org/10.4313/JKEM.2008.21.2.144

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Production and characterization of glass/cordierite/hBN composites for low temperature co-fired ceramic applications
Oğuzhan Bilaç, Gülsüm Topateş, Cihangir Duran
Ceramics International.2025; 51(10): 12381. CrossRef

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A Study on Composition of Position Detection System using GPS: Young Jae Han, Choon Soo Park, Tae Hyoung Lee, Ki Hwan Kim, Jong Phil Eun; J Korean Inst Electr Electron Mater Eng 2008;21(2):151-155. Published online February 1, 2008; DOI: https://doi.org/10.4313/JKEM.2008.21.2.151

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Fabrication and Properties of Vanadium Oxide Thin Films for Microbolometer by using Plasma Atomic Layer Deposition Method: Hyeong Seon Yun, Soon Won Jung, Sang Hyun Jeong, Kwang Ho Kim, Chang Auck Choi, Byoung Gon Yu; J Korean Inst Electr Electron Mater Eng 2008;21(2):156-161. Published online February 1, 2008; DOI: https://doi.org/10.4313/JKEM.2008.21.2.156

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Effect of an Al underlayer on the Growth of Carbon Nanotubes and Their Field Emission Characteristics: Seung Hwan Lee, Jeung Choon Goak, Han Sung Lee, Nae Sung Lee; J Korean Inst Electr Electron Mater Eng 2008;21(2):162-172. Published online February 1, 2008; DOI: https://doi.org/10.4313/JKEM.2008.21.2.162

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Electrical and Optical Properties of Top Emission OLEDs with CsCl Passivation Layer: So Youn Kim, Dae Gyu Moon, Jeong In Han; J Korean Inst Electr Electron Mater Eng 2008;21(2):173-177. Published online February 1, 2008; DOI: https://doi.org/10.4313/JKEM.2008.21.2.173

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Effect of Performance in Dye-sensitized Solar Cells by PEG Contents: Hyoung YouI Baek, Zhen Ji Han, Hu Li, Hal Bon Gu, Kyung Hee Park; J Korean Inst Electr Electron Mater Eng 2008;21(2):178-181. Published online February 1, 2008; DOI: https://doi.org/10.4313/JKEM.2008.21.2.178

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A Study on the Series Arc Detection in Low-voltage Wiring Systems: Il Kwon Kim, Dae Won Park, Su Yeon Choi, Chan Yong Park, Hwang Kuk Kim, Gyung Suk Kil; J Korean Inst Electr Electron Mater Eng 2008;21(2):182-187. Published online February 1, 2008; DOI: https://doi.org/10.4313/JKEM.2008.21.2.182

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Dielectric Properties of Epoxy/Organically Modified Layered Silicate Nanocomposites: Jae Jun Park; J Korean Inst Electr Electron Mater Eng 2008;21(2):188-193. Published online February 1, 2008; DOI: https://doi.org/10.4313/JKEM.2008.21.2.188

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