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Volume 8(3); May 1995

Development of Low Power Type Sensor for the DO Concentration Measurement by Clark Electrode: Rhie Dong Hee; J Korean Inst Electr Electron Mater Eng 1995;8(3):254-260.

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Variations of Ferroelectric Properties with the addition of Yttrium Acetate in the Pb ( Zr0.65Ti0.35 ) O3 Thin Films Prepared by Sol - Gel Processing: Joon Han Kim, Kyu Seon Lee, Doo Hee Lee, Chang Yub Park; J Korean Inst Electr Electron Mater Eng 1995;8(3):261-266.

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A Study on the Dielectric Properties of the ( Sr0.50Pb0.25Ba0.25 ) TiO3 Ceramics: Se Il Kim, Jang Ho Chung, Sung Gap Lee, Seon Gi Bae, Young Hie Lee; J Korean Inst Electr Electron Mater Eng 1995;8(3):267-271.

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Stimulated Emission from Optically Pumped Column - Ill Nitride Semiconductors at Room Temperature .: Seon Tai Kim, dong Chan Moon; J Korean Inst Electr Electron Mater Eng 1995;8(3):272-277.

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A Study on Characteristics of Thin Film SnO2 Gas Sensor: Sang Yeon Kim, Joon Tae Song; J Korean Inst Electr Electron Mater Eng 1995;8(3):278-284.

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The Properties of Y1Ba2Cu3O7-x Superconducting Thin Films Deposited by ' Off - axis ' Pulsed Laser Deposition: Byung Moo Moon; J Korean Inst Electr Electron Mater Eng 1995;8(3):285-290.

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InP Crystal Growth by Modified SSD Method: Bok Sik SONG, Sung Hoon CHUNG, Dong Chan MOON, Seon Tai KIM; J Korean Inst Electr Electron Mater Eng 1995;8(3):291-296.

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Properties of CulnSe2 Thin Films Selenizing Indium / Copper Layers Prepared by D . C . Magnetron Sputtering: Sang Kyu han, Sun Jae Kim, Hyung bock Lee, Byung Ha Lee, Sung Park; J Korean Inst Electr Electron Mater Eng 1995;8(3):298-304.

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A Study on the Electrical Characteristics and the Growth of Al2O3 Film on Si with Low Temperatures by GAIVBE Technique: Man Young Sung, Tae Ik Kim, Byoung Moo Mun, K . V . Rao, Sung Hee Park; J Korean Inst Electr Electron Mater Eng 1995;8(3):306-315.

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Surface Treatment of Polyethylene Terephthalate Films by Corona Discharge: Myong Ryeong Kim; J Korean Inst Electr Electron Mater Eng 1995;8(3):316-323.

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Effect of Particle Size Distribution on The Magnetic Properties of Hexagonal Strontium Ferrite: Song Chang Yul, Shin Yong Deok; J Korean Inst Electr Electron Mater Eng 1995;8(3):324-330.

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The Guided Field Distribution Characteristics in the Ion - Exchange Channel Glass Waveguide .: J . I . Park, T . S . Park, S . P . Chun, H . B . Chung; J Korean Inst Electr Electron Mater Eng 1995;8(3):332-339.

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Copper , Aluminum Based Metallization for Display Applications: Hyung Taek Kim, Seon Gi Bae; J Korean Inst Electr Electron Mater Eng 1995;8(3):340-351.

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Growth Mechanism of Anodic oxide for MCT Passivation: Jin Won Jung, Jin Suk Wang; J Korean Inst Electr Electron Mater Eng 1995;8(3):352-356.

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A study on the degradation by the hot carrier trapping of the submicron MOSFET with long stress condition: Soon Seuk Hong; J Korean Inst Electr Electron Mater Eng 1995;8(3):357-361.

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Development status of silicon solar cell: Eun Chel Cho, Young Hyun Cho, Dong Seop Kim, Soo Hong Lee, Il Hwan Ji; J Korean Inst Electr Electron Mater Eng 1995;8(3):362-370.

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Test Method of Powder Properties for Electronic Ceramics: Woo Sik Um, In Shik Lee; J Korean Inst Electr Electron Mater Eng 1995;8(3):372-381.

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