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Volume 7(6); November 1994

The Measurement of Electron Drift Velocity and Analysis of Transport Coefficients in SF6 + N2 Gas .: Sung Chul Ha, Young Sun Ha; J Korean Inst Electr Electron Mater Eng 1994;7(6):462-472.

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Elastic and Inelastic Electron Tunneling Characteristics in Polyimide LB Films: Tae Sung Kim, Hyun Jong Kim, Mitsumasa Iwamoto; J Korean Inst Electr Electron Mater Eng 1994;7(6):473-479.

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Electrical Characteristics of SnO2 / Si Heterojunction Solar Cells Depending on Annealing Temperature: Jae Hyoung Lee, Yong Kwan Park; J Korean Inst Electr Electron Mater Eng 1994;7(6):481-489.

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Band - Gap Energy ( Eo ) Measurements of Semi - Insulating GaAs by Photoreflectance: In Ho Bae, Mal Moon Kim, Jung Yeul Lee, In Soo Kim, Ki Hong Kim; J Korean Inst Electr Electron Mater Eng 1994;7(6):490-495.

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Investigation on the Property and Preparation of Ferroelectric Pb ( Zr , Ti ) O3 by Sol - Gel Method: Jung Han Rim, Young Sig Kim, Pok Kie Chang; J Korean Inst Electr Electron Mater Eng 1994;7(6):496-502.

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Measurement on the Deep Levels of Cd4GeSe6 Single Crystals: Duck Tae Kim; J Korean Inst Electr Electron Mater Eng 1994;7(6):504-510.

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The effect of deposition condition on the oxidation of TbFeCo thin films in facing targets sputtering system: Jeong Tak Moon, Myung Han Kim; J Korean Inst Electr Electron Mater Eng 1994;7(6):511-519.

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A Study on the Functional Application of Conducting Polymer: Jong Ok Kim, Hyun Chol Kim, In Sung Jung, Hyun Kwan Kim, Hal Bon Koo, Tae Sung Kim; J Korean Inst Electr Electron Mater Eng 1994;7(6):520-525.

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A Study on the Improvement of Thermostability and Dielectric Breakdown Strength for Packaging and Impregnating Epoxy Composite Materials for Electrical machines and Apparatus: Myung Ho Kim, Jae Hwan Kim; J Korean Inst Electr Electron Mater Eng 1994;7(6):527-533.

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Microstructure and Dielectric Properties with a contents Ca of ( Sr . Ca ) TiO3 - based Grain Boundary Layer Ceramics: Woon Shik Choi, Chung Hyeok Kim, Joon Ung Lee; J Korean Inst Electr Electron Mater Eng 1994;7(6):534-542.

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Impedance Measurements of Solid Electrolyte: Hal Bon Gu, Hyun Cheol Kim; J Korean Inst Electr Electron Mater Eng 1994;7(6):543-548.

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Technology Trend of Optoelectronic Device: Young Choon Ra, Jang Yun Jo, Dae Hee Park; J Korean Inst Electr Electron Mater Eng 1994;7(6):549-556.

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