Memristors, as next-generation memory devices, have garnered significant academic interest. Among them, TiO₂/TiO_2-x based memristors have particularly attracted substantial scholarly attention. Research on the activation and stability of TiO2 based memristor devices through process parameters is essential. Here, to determine the impact of process parameters on the activation of TiO₂/TiO_2-x based memristor devices, we fabricated the memristor devices using a sputtering system andconducted annealing at 400℃. Additionally, to analyze the electrical characteristics of the devices, we measured the I-V curves and C-V curves. Also, we examined TiO₂/TiO_2-x based memristor devices surface using SEM. Consequently, it was observed that the devices subjected to annealing exhibited improved hysteresis curves in the I-V characteristics, a reduced bandgap, and changes in resistance compared to the non-annealed devices. The retention test results further demonstrated that the set/reset characteristics of the devices were stable, confirming their potential applicability as memory devices.

The value of experimentally obtained data becomes highest when they are properly analyzed based on valid logics. Many physical and chemical properties such as electrical and magnetic properties, chemical reaction rates, etc. are known to be thermally activated; thus, a proper understanding of thermally-activated processes is of importance. However, there are still a number of papers published with falsely analyzed data. In this contribution, we would like to revisit the meaning of thermally-activated processes, and then reanalyze a data set published misinterpreted. By showing a step-by-step procedure for the reanalysis, we would like to help researchers who may come across such data in the future not to make mistakes in their analysis.

The activation energy of a material is an important factor that significantly affects the lifetime and can be used to develop a degradation model. In this study, a thermal analysis was carried out to evaluate and collect quantitative data on the degradation of insulation materials like EPR and CSP used for nuclear power plant cables. The activation energy was determined from the relationship between log β and 1/T based on the Flynn-Wall-Ozawa method, by a TGA test. The activation energy was also derived from the relationship between ln(t) and 1/T based on isothermal analysis, by an OIT test. The activation energy of EPR derived from thermal analysis was used to calculate the accelerated aging time corresponding to the number of years of use, employing the Arrhenius equation, and determine the elongation corresponding to the accelerated aging time.

In this paper, EPR (ethylene propylene rubber) insulation material was accelerated degradation test at 121℃, 136℃, 151℃, and experiment the typical EAB (elongation at break) at mechanical characteristics analysis. It is shown that the failure-time at the point of 50% of the initial value of Elongation rate to obtain the activation energy. The failure-time was shown each 5,219 hr, 3,165 hr, and 668 hr at three temperatures. In order to derive the activation energy, Arrhenius methodology was applied. Also, we got the Arrhenius plot from three accelerated temperatures. The activation energy values got 0.98 eV from EAB test. The experimental data were evaluated for estimating the probability density, and the suitable distribution by using statistical program MINITAB. It is shown that EAB data by the acceleration thermal degradation is most suitable for the Weibull distribution.

The characteristics of dielectric constant and tanδ of low viscosity silicone oils with changing degree of polymerization were investigated. The result shows dipole loss mechanism at low temperature range. The dielectric loss in the range of low frequencies are predominantly of ionic nature with temperature increase. The peak of dielectric loss is the detrapping of the electrons which is were trapped in the localized level of the silicone oils at the frequency of 30 kHz. The increase of ionic conduction is attributed to the presence of ionizable oxidation products and their increased dissociation feature. The activation energy △H and dipole moment μd were increased whit increasing degree of polymerization.