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"Adhesion force"

Electrical and Structural Properties of Ti Thin Films on Al2O3 Substrate
Un Jo Jeong, Hyeon Hun Yang, Jeong Myeong Im, Yeong Jun Kim, Gye Chun Park
J Korean Inst Electr Electron Mater Eng 2003;16(9):753-758.   Published online September 1, 2003
DOI: https://doi.org/10.4313/JKEM.2003.16.9.753
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