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"Current testing"
Design and Fabrication of the Built-in Testing Circuit for Improving IC Reliability
J Korean Inst Electr Electron Mater Eng
2005;18(5):431-438.
Published online May 1, 2005
DOI:
https://doi.org/10.4313/JKEM.2005.18.5.431
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Citations
Citations to this article as recorded by
A Burn-in Test System with Dynamic Bone Allocation
Sam-Kweon Oh, Joong-Han Shin
Journal of the Korea Academia-Industrial cooperation Society.2009; 10(1): 75.
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