Design and Fabrication of the Built-in Testing Circuit for Improving IC Reliability

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IC 신뢰성 향상을 위한 내장형 고장검출 회로의 설계 및 제작

유장우, 김후성, 윤지영, 황상준, 성만영

Design and Fabrication of the Built-in Testing Circuit for Improving IC Reliability

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J Electr Electron Mater 2005;18(5):431-438.
Published online: May 1, 2005

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Keywords: Current testing, Built-in current sensor, BICS, Iddq testing, Testability

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Design and Fabrication of the Built-in Testing Circuit for Improving IC Reliability

J Electr Electron Mater. 2005;18(5):431-438. Published online May 1, 2005

Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.

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Design and Fabrication of the Built-in Testing Circuit for Improving IC Reliability

J Electr Electron Mater. 2005;18(5):431-438. Published online May 1, 2005

Articles

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IC 신뢰성 향상을 위한 내장형 고장검출 회로의 설계 및 제작

Design and Fabrication of the Built-in Testing Circuit for Improving IC Reliability

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