Breakdown strength is an essential parameter for evaluating the electrical performance and degradation behavior of cable insulation and IEC 60243 also emphasizes its importance for detecting changes in insulation characteristics due to aging. However, the current IEC standards are mainly limited to specifying electrode configurations and test voltage conditions for breakdown tests, while the influence of insulating oil, is not clearly addressed. In this study, the breakdown strength of a 66 kV wet-type submarine cable was experimentally evaluated using insulating oils with different kinematic viscosities of 10, 100, 500, and 1,000 cSt in order to achieve reliable and reproducible breakdown measurements. The experimental results show that the measured breakdown strength decreases by up to approximately 20% depending on the oil viscosity. This indicates that the viscosity of the insulating oil has a significant influence on the measured breakdown strength during breakdown test. Therefore, it is necessary to perform breakdown strength measurements under identical test conditions, including the physical properties of the insulating oil, to ensure reliable comparison and accurate assessment of insulation performance and degradation characteristics.

The key to determining the lifetime of OLED device is how much brightness can be maintained. It can be said that there are internal and external causes for the degradation of OLED devices. The most important cause of internal degradation is bonding and degradation in the excited state due to the electrochemical instability of organic materials. The structure of OLED modeled in this paper consists of a cathode layer, electron injection layer (EIL), electron transport layer (ETL), light emission layer, hole transport layer (HTL), hole injection layer (HIL), and anode layer on a glass substrate from top to bottom. It was confirmed that the temperature generated in OLED was distributed around the maximum of 343.15 K centered on the emission layer. It can be seen that the heat distribution generated in the presented OLED structure has an asymmetrically high temperature distribution toward the cathode, which is believed to be because the sizes of the cathode and positive electrode are asymmetric. Therefore, when designing OLED, it is believed that designing the structures of the cathode and anode electrodes as symmetrically as possible can ensure uniform heat distribution, maintain uniform luminance of OLED, and extend the lifetime. The thermal distribution of OLED was analyzed using the finite element method according to Comsol 5.2.

In a solar cell, degradation refers to the decrease in performance parameters caused by defects originated due to various causes. During the fabrication process of solar cells, degradation is generally related to the processes such as passivation or firing. There exist sources of many types of degradation; however, the exact cause of Light and elevated Temperature Induced Degradation (LeTID) is yet to be determined. It is reported that the degradation and the regeneration occur due to the recombination of hydrogen and an arbitrary substance. In this paper, we report the deposition of Al₂O₃ and SiN_X on silicon wafers used in the Passivated Emitter and Rear Contact (PERC) solar structure and its degradation pattern. A higher degradation rate was observed in the sample with single layer of Al₂O₃ only, which indicates that the degradation is affected by the presence or the absence of a passivation thin film. In order to alleviate the degradation, optimization of different steps should be carried out in consideration of degradation in the solar cell fabrication process.

Heaters using the resistance heating principle are used in various industrial fields that require heat and are also essentially used in bidet among small home appliances. A planar heater and a coil-inserted heater mounted on a conventional commercially used bidet have disadvantages and limitations of complicated manufacturing process and local heating. In this study, silver-palladium (Ag-Pd) powder material was used for a screen-printing process that is more advantageous in achieving simplification than the existing process, and a rod-type heater for bidet was manufactured. The on-off cycle test under actual conditions was conducted to confirm the durability and the capability of the fabricated heater, and the fabricated heater operated more than 2,600 on-off cycles, which means it could be applied for a commercial product. In addition, through the on-off cycles under harsh conditions, the cause of failure was identified after the test that the durability limit temperature of the heater was 850℃. Through Ag-Pd rod heater in this study, it is expected to contribute to the efficient development of electrode materials for heaters and the improvement of the durability of heaters in the future.

In this work, the magnetic arc reduction phenomena encountered in AC relay contacts were analyzed. To this end, arc duration, instantaneous voltage, and current changes due to changes in the magnetic field were observed. The arc generated at the contact point was affected by the magnitude of the applied magnetic field; the voltage and current waveforms rapidly intersected, resulting in a decrease in arc duration and arc energy. Furthermore, the orientation of the N pole of the magnetic field was found to play a role in the effectiveness of potential arc prevention.

In this study, the capacity and FTIR of polycarbonate film that was degraded for 2, 4, and 8 h in a thermostat at 180℃ was measured. The results of this study are as follows. It was found that the capacity decreased with increasing degradation time and frequency. This findings suggest that the attraction between molecules and amorphous polycarbonate increased because it contains the ketone group (-C=O-) and the chain of dioxides group (-O-R-O-). Measurement by FTIR found that the time of thermal degradation has a smaller impact because the transmutation or variation of the material does not occur. Measurement by SEM magnified 1,000 times found that a longer thermal degradation time results in thermal decomposition of the specimen’s particles.

In this study, the thermal degradation properties of polyethylene terephthalate film has been examined by the capacitance, Tan δ, thermography, FTIR, and SEM results at temperatures of 90~170℃ and frequencies of 0.3~3,000 kHz. It was found that the capacitance decreased with increasing thermal imaging temperature, probably caused by weakening of chemical bond with increasing temperature. Tan δ decreased upon increasing temperature from 90℃ to 170℃, probably due to the molecular motion of COOH radical or OH radical. The FT-IR measurement reveals that no structural change of the material occurs upon thermal radiation. The SEM measurement shows that the material is stabilized by thermal decomposition with increasing temperature; however, excessive thermal degradation obstructs the stabilization of the material.

The degradation mechanism of Mo_xW_1-xSi₂ ultrahigh-temperature heating elements fabricated by selfpropagating high-temperature synthesiswas investigated. The Mo_xW_1-xSi₂ specimens (with and without post-annealing) were subjected to ADTs (accelerated degradation tests) at temperatures up to 1,700℃ at heating rates of 3, 4, 5, 7, and 14℃/min. The surface loads of all the specimen heaters were increased with the increase in the target temperature. For the Mo_xW_1-xSi₂ specimens without annealing, many pores and secondary-phase particles were observed in the microstructure; the surface load increased to 23.9 W/㎠ at 1,700℃, while the bending strength drastically reduced to 242 MPa. In contrast, the Mo_xW_1-xSi₂ specimens after post-annealing retained single- Mo_xW_1-xSi₂ phases and showed superior durability after the ADT. Consequently, it is thought that the formation of microcracks and coarse secondary phases during the ADT are the main causes for the degraded performance of the Mo_xW_1-xSi₂ heating elements without post-annealing.

Degradation diagnosis of cable is one of major issues for operation and maintenance in overhead distribution power lines. The diagnostic system for overhead power lines is composed of three parts in functional aspect - a travelling unit, a sensing unit and a communication unit. Among them, sensor detects the defects such as corrosion and disconnecting of power lines. Performance of sensor is very important, and besides, the size and structure of sensor is restricted for installation to small and lightweight diagnostic system. This paper suggests an optimal eddy current sensor best suit for small and lightweight diagnostic system in consideration of detecting performance, size and ease of installation and so on. Proposed sensor has been designed by Drum core structure and can be applied to the all domestic overhead power lines regardless of the cross-sectional areas. Also, it is showed that results of mock environmental test are satisfied.

At present, the development of a detection device in order to prevent accidents due to wire deterioration in the distribution lines is required. Distribution line is not possible to check the internal state in a normal way because it is covered with the coating. Accordingly, various eddy current techniques that is the non-destructive test (NDT) techniques have been applied to solve this problem. In this paper, we have seen examining the characteristic change of the eddy current sensor according to the simplified shape of the sensor in order to solve the problems for the simplified shape that is generated when the simulation for the shape of the eddy current sensor.

nternal corrosion of the distribution line can be detected in order to develop techniques ofnon-destructive inspection methods that operate only on the metal track eddy current diagnosis ispossible by applying the technique investigated. Sensor for the production of a finite element methodmodeled by using an eddy current sensor, a distribution line by using an accelerated aging samples ofsodium hydroxide was prepared. Sheathed cables for internal corrosion studies detected using an eddycurrent sensor is considered to be possible.

Reported here are results of the mechanical and electrical properties of both of intact and thermally degraded epoxy-coated copper busducts that are made by fluidized bed process. To elucidate and compare the properties mentioned above, electrical breakdown by thermal and water aging, v-t characteristic, bending test, impact test and cross cut test are carried out. Although the performance of electrical and mechanical properties are gradually decreased in increasing the severe conditions such as temperature, aging time, and so forth, sample C has a better performance in both mechanical and electrical properties.

In this study, the surface modification for a silicon(Si) mold using CHF3 inductively coupled plasma(ICP). The conditions under that plasma was treated a input ICP power 600 W, an operating gas pressure of 10 mTorr and plasma exposure time of 30 sec. The Si mold surface became hydrophobic after plasma treatment in order to CF(x)(X= 1,2,3) polymer. However, as the de-molding process repeated, it was investigated that the contact angle of Si surface was decreased. So, we attempted to investigate the degradation mechanism of the accurate pattern transfer with increasing the count of the de-molding process using scanning electron microscope (SEM), contact angle, and x-ray photoelectron spectroscopy (XPS) analysis of Si mold surface.

Poly Si TFTs (poly silicon thin film transistors) with p channel those are annealed HT (high t emperature) with gate poly crystalline silicon and LT (low temperature) with metal gate electrode were fabricated on quartz substrate using the analyzed data and compared according to the activated grade silicon thin films and the size of device channel. The electrical characteristics of HT poly-Si TFTs increased those are the on current, electron mobility and decrease threshold voltage by the quality of particles of active thin films annealed at high temperature. But the on/off current ratio reduced by increase of the off current depend on the hot carrier applied to high gate voltage. Even though the size of the particles annealed at low temperature are bigger than HT poly-Si TFTs due to defect in the activated grade poly crystal silicon and the grain boundary, the characteristics of LT poly-Si TFTs were investigated deterioration phenomena those are decrease the electric off current, electron mobility and increase threshold voltage. The results of transconductance show that slope depend on the quality of particles and the amplitude depend on the size of the active silicon particles.

Analyzing electrical degradation of polycrystalline silicon transistor to applicable at several environment is very important issue. In this research, after fabricating p channel poly crystalline silicon TFT (thin film transistor) electrical characteristics were compare and analized that changed by gate bias with first measurement. As a result on and off current was reduced by variation of gate bias and especially re duce ratio of off current was reduced by 7.1×101. On/off current ratio, threshold voltage and electron mobility increased. Also, when channel length gets shorter on/off current ratio was increased more and thresh old voltage increased less. It was cause due to electron trap and de-trap to gate silicon oxide by variation of gate bias.

In this thesis, the partial discharge according to applied voltage and variations of cross-sectional area and length of the conductor related to general condition for using cable was measured in order to study degradation diagnosis for 2-Core cable of the PVC insulator used in industrial fields for other safety installations. Also the thermal degradation conditions under various installation circumstances of cables were studied by assuming degradation conditions with each different degradation rate (50%, 67%, 100%) such as variation in degradated temperature, thermal exposure time, normal state, partially degradated state and overall degradated state for thermal degradation diagnosis. The quantity of electric discharge (V-Q) according to applied voltage was measured for measurement of inception voltage and extinction voltage. The quantity of electric discharge and the number of electric discharge (Q-N) were measured with applied voltage kept constantly. In addition, pictures were taken using SEM (scanning electron microscope) to compare the surface of external insulator to degradated state of internal insulator according to thermal degradation temperature and also compare the surface of external insulator to degradated surface state of internal insulator according exposure time of cables to thermal stress.