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"Electrical parameter"

The Analysis of Degradation Characteristics in Poly-Silicon Thin Film Transistor Formed by Solid Phase Crystallization
Eun Sik Jung, Yong Jae Lee
J Korean Inst Electr Electron Mater Eng 2003;16(1):26-32.   Published online January 1, 2003
DOI: https://doi.org/10.4313/JKEM.2003.16.1.026
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