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The Analysis of Degradation Characteristics in Poly-Silicon Thin Film Transistor Formed by Solid Phase Crystallization

Eun Sik Jung, Yong Jae Lee
J Electr Electron Mater 2003;16(1):26-32.
Published online: January 1, 2003
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The Analysis of Degradation Characteristics in Poly-Silicon Thin Film Transistor Formed by Solid Phase Crystallization
J Electr Electron Mater. 2003;16(1):26-32.   Published online January 1, 2003
Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.

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The Analysis of Degradation Characteristics in Poly-Silicon Thin Film Transistor Formed by Solid Phase Crystallization
J Electr Electron Mater. 2003;16(1):26-32.   Published online January 1, 2003
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