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"Epi Layer"

Study on Modeling of GaN Power FET
Ey Goo Kang, Hun Suk Chung, Beum Jun Kim, Young Hun Lee
J Korean Inst Electr Electron Mater Eng 2009;22(12):1018-1022.   Published online December 1, 2009
DOI: https://doi.org/10.4313/JKEM.2009.22.12.1018
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