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"Extinction coefficient"

A Study of Optical Characteristics Correlated With Low Dielectric Constant of SiOCH Thin Films Through Ellipsometry
Yong Heon Park
J Korean Inst Electr Electron Mater Eng 2010;23(3):228-233.   Published online March 1, 2010
DOI: https://doi.org/10.4313/JKEM.2010.23.3.228
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