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"Interface charge"

Effect of Interface Charges on the Transient Characteristics of 4H-SiC DMOSFETs
Min Seok Kang, Kyoung Sook Moon, Sang Mo Koo
J Korean Inst Electr Electron Mater Eng 2010;23(6):436-439.   Published online June 1, 2010
DOI: https://doi.org/10.4313/JKEM.2010.23.6.436
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