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"Interface trap charge (Qit)"

Dependency of the Device Characteristics on Plasma Nitrided Oxide for Nano-scale PMOSFET
J Korean Inst Electr Electron Mater Eng 2007;20(7):569-574.   Published online July 1, 2007
DOI: https://doi.org/10.4313/JKEM.2007.20.7.569
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