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"Low-frequency noise"

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"Low-frequency noise"

Analysis of the Threshold Voltage Instability of Bottom-Gated ZnO TFTs with Low-Frequency Noise Measurements
Kwang Seok Jeong, Young Su Kim, Jeong Gyu Park, Seung Dong Yang, Yu Mi Kim, Ho Jin Yun, In Shik Han, Hi Deok Lee, Ga Won Lee
J Korean Inst Electr Electron Mater Eng 2010;23(7):545-549.   Published online July 1, 2010
DOI: https://doi.org/10.4313/JKEM.2010.23.7.545
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