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"PCRAM"

Regular Paper : Semiconductor ; The Phase-change Memory Characteristics of Ge1Se1Te2 Thin Films for Sb Photo Doping
Ki Hyun Nam, Jang Han Kim, Hong Bay Chung
J Electr Electron Mater 2012;25(5):329-333.   Published online May 1, 2012
For phase transition method, good record sensitivity, low heat radiation, fast crystallization and hi-resolution are essential. Also, a retention time is very important part for phase-transition. In our past papers, we chose composition of Ge1Se1Te2 material to use a Se factor which has good optical sensitivity than conventional Sb. Sb/Ge-Se-Te thin films are fabricated and irradiated with UV light source to investigate a reversible phase change by Sb-doped condition. Because of Sb atoms, the Sb inserted sample showed better performance than conventional one. We should note that this novel one showed another possibility for phase-change random access memory.
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