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J Electr Electron Mater : Journal of Electrical and Electronic Materials

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반도체 : Sb 광도핑에 의한 Ge1Se1Te2 박막의 상변화 메모리 특성

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Regular Paper : Semiconductor ; The Phase-change Memory Characteristics of Ge1Se1Te2 Thin Films for Sb Photo Doping

Ki Hyun Nam, Jang Han Kim, Hong Bay Chung
J Electr Electron Mater 2012;25(5):329-333.
Published online: May 1, 2012
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For phase transition method, good record sensitivity, low heat radiation, fast crystallization and hi-resolution are essential. Also, a retention time is very important part for phase-transition. In our past papers, we chose composition of Ge1Se1Te2 material to use a Se factor which has good optical sensitivity than conventional Sb. Sb/Ge-Se-Te thin films are fabricated and irradiated with UV light source to investigate a reversible phase change by Sb-doped condition. Because of Sb atoms, the Sb inserted sample showed better performance than conventional one. We should note that this novel one showed another possibility for phase-change random access memory.

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Regular Paper : Semiconductor ; The Phase-change Memory Characteristics of Ge1Se1Te2 Thin Films for Sb Photo Doping
J Electr Electron Mater. 2012;25(5):329-333.   Published online May 1, 2012
Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.

Format:
Include:
Regular Paper : Semiconductor ; The Phase-change Memory Characteristics of Ge1Se1Te2 Thin Films for Sb Photo Doping
J Electr Electron Mater. 2012;25(5):329-333.   Published online May 1, 2012
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