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PMOSFET
WHERE t1.sid in(parameter_dbtbl_keyword '%PMOSFET%') and t1.xml_status <> 99
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"PMOSFET"
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Barrier height (1)
Gate oxidation anneal (1)
High performance PMOSFET (1)
NBTI (1)
Ni-silicide (1)
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2009 (1)
2003 (1)
Authors
Soon Yen Jung (1)
Young Min Kim (1)
Sun Kyu Kong (1)
Ga Won Lee (1)
Hi Deok Lee (1)
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Keywords
Barrier height (1)
Gate oxidation anneal (1)
High performance PMOSFET (1)
NBTI (1)
Ni-silicide (1)
Pd stacked structure (1)
PMOSFET (1)
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Young Min Kim (1)
Sun Kyu Kong (1)
Ga Won Lee (1)
Hi Deok Lee (1)
Shi Guang Li (1)
Kee Young Park (1)
Hong Sik Shin (1)
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Ying Ying Zhang (1)
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2003 (1)
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"PMOSFET"
Reduction of Barrier Height between Ni-silicide and P+ Source/drain for High Performance PMOSFET
Sun Kyu Kong, Ying Ying Zhang, Kee Young Park, Shi Guang Li, Soon Yen Jung, Hong Sik Shin, Ga Won Lee, Jin Suk Wang, Hi Deok Lee
J Electr Electron Mater
2009;22(6):457-461.
Published online June 1, 2009
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Impact of Post Gate Oxidation Anneal on Negatlve Bias Temperature Instability of Deep Submicron PMOSFETs
Young Min Kim
J Electr Electron Mater
2003;16(3):181-185.
Published online March 1, 2003
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