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"Power semiconductor"

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"Power semiconductor"

Evaluation of Performance and Output Characteristics of Half-Bridge Bare Die 4H-SiC MOSFETs Under Variations of Switching Frequency and Duty Cycle
Yujin Seok, Hyoung Woo Kim, Ho-jun Lee, Chang-seung Ha
J Electr Electron Mater 2026;39(1):70-78.   Published online January 1, 2026
DOI: https://doi.org/10.4313/JEEM.2026.39.1.9
Silicon carbide (SiC) MOSFETs provide superior performance compared to traditional silicon devices under hightemperature and high-power conditions, making them particularly valuable for power electronics applications requiring highfrequency switching and high-energy efficiency. As the electric vehicle (EV) market expands, these devices are commonly packaged into six-pack modules, which can show their different electrical characteristics between the bare-die device and the package due to packaging that improves heat dissipation and other properties. This study uses bare-die SiC MOSFETs to explore their intrinsic characteristics and evaluate their performance in a half-bridge configuration. A half-bridge circuit was constructed, and performance was assessed by varying driving frequencies (10 kHz and 50 kHz) and adjusting the duty cycle between 20% and 80%. Analysis revealed that, at a fixed switching frequency, the average output voltage and average output current are proportional to the duty cycle.
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Analysis of the Electrical Characteristics of the β-Ga₂O₃ JFET by Using Nitrogen Doping
Hyoung Woo Kim, Jung Hun Kim, Jae Hwa Seo
J Electr Electron Mater 2025;38(2):207-212.   Published online March 1, 2025
DOI: https://doi.org/10.4313/JKEM.2025.38.2.12
In this study, we proposed β-Ga₂O₃ JFET using nitrogen doping and analyzed the electrical characteristics. In β-Ga₂O₃, nitrogen ions act as a deep acceptor and are used to implement the current blocking layer. By using this characteristic of the nitrogen ion, in the proposed JFET, nitrogen ions are used to obtain gate control and pinch off the channel of the JFET. The numerical TCAD simulation was performed to design and analyze the proposed JFET. The simulated forward and reverse characteristics of the proposed JFET were obtained as a function of JFET width and nitrogen doping concentration. The maximum breakdown voltage of 1.7 kV was obtained with the on-resistance of 16.7 mΩ·cm2 when the channel width was 1.5 μm and nitrogen doping concentration is 1×1018/cm3, respectively.
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A Brief Review of Power Semiconductors for Energy Conversion in Photovoltaic Module Systems
Hyeong Gi Park, Do Young Kim, Junsin Yi
J Electr Electron Mater 2024;37(2):133-140.   Published online March 1, 2024
DOI: https://doi.org/10.4313/JKEM.2024.37.2.2
This study offers a comprehensive evaluation of the role and impact of advanced power semiconductors in solar module systems. Focusing on silicon carbide (SiC) and gallium nitride (GaN) materials, it highlights their superiority over traditional silicon in enhancing system efficiency and reliability. The research underscores the growing industry demand for high-performance semiconductors, driven by global sustainable energy goals. This shift is crucial for overcoming the limitations of conventional solar technology, paving the way for more efficient, economically viable, and environmentally sustainable solar energy solutions. The findings suggest significant potential for these advanced materials in shaping the future of solar power technology.
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A Study on Optimizing Unit Process Ring Pattern Design for High Voltage Power Semiconductor Device Development
Gyu Cheol Choi, Duck-youl Kim, Bonghwan Kim, Sang Mok Chang
J Electr Electron Mater 2023;36(2):158-163.   Published online March 1, 2023
DOI: https://doi.org/10.4313/JKEM.2023.36.2.8
Recently, the global demands for high voltage power semiconductors are increasing across various industrial fields. The use of electric cars with high safety and convenience is becoming practical, and IGBT modules of 3.3 kV and 1.2 kA or higher are used for electric locomotives. Delicate design and advanced process technology are required, and research on the optimization of high-voltage IGBT parts is urgently needed in the industry. In this study, we attempted to design a simulation process through TCAD (technology computer-aid design) software to optimize the process conditions of the fielding process among the core unit processes for an especial high yield voltage. As well, the prior circuit technology design and a ring pattern with a large number of ring formation structures outside the wafer similar to the chip structure of other companies were constructed for 3.3 kV NPT-IGBT through a unit process demonstration experiment. The ring pattern was designed with 21 rings and the width of the ring was 6.6 μm. By changing the spacing between patterns from 17.4 μm to 35.4 μm, it was possible to optimize the spacing from 19.2 μm to 18.4 μm.
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Electrical Characteristics of Floating Island IGBT Using Trench Gate Structure
Yu Seup Cho, Eun Sik Jung, Kum Mi Oh, Man Young Sung
J Electr Electron Mater 2012;25(4):247-252.   Published online April 1, 2012
IGBT (insulated gate bipolar transistor) has been widely used around the power industry as it has good switching performance and its excellent conductance. In order to reduce power loss during switch turn-on state, it is essential to reduce its resistance. However, trade off relationship between breakdown voltage and device conductance is the greatest obstacle on the way of improvement. Floating island structure is one of the solutions. Still, under optimized device condition for the best performance, improvement rate is negligible. Therefore, this paper suggests adding trench gate on floating island structure to eliminate JFET (junction field effect transistor) area to reduce resistance and activate floating island effect. Experimental result by 2D simulation using TCAD, shows 20% improvement of turn-on state voltage drop.
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A Study on the Electrical Characteristics in the Static Induction Transistor with Trench Oxide
J Electr Electron Mater 2005;18(1):6-11.   Published online January 1, 2005
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