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질소 이온 도핑을 이용한 산화갈륨 JFET의 전기적 특성 분석

김형우, 김중헌, 서재화

Analysis of the Electrical Characteristics of the β-Ga₂O₃ JFET by Using Nitrogen Doping

Hyoung Woo Kim, Jung Hun Kim, Jae Hwa Seo
J Electr Electron Mater 2025;38(2):207-212.
Published online: March 1, 2025
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In this study, we proposed β-Ga₂O₃ JFET using nitrogen doping and analyzed the electrical characteristics. In β-Ga₂O₃, nitrogen ions act as a deep acceptor and are used to implement the current blocking layer. By using this characteristic of the nitrogen ion, in the proposed JFET, nitrogen ions are used to obtain gate control and pinch off the channel of the JFET. The numerical TCAD simulation was performed to design and analyze the proposed JFET. The simulated forward and reverse characteristics of the proposed JFET were obtained as a function of JFET width and nitrogen doping concentration. The maximum breakdown voltage of 1.7 kV was obtained with the on-resistance of 16.7 mΩ·cm2 when the channel width was 1.5 μm and nitrogen doping concentration is 1×1018/cm3, respectively.

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Analysis of the Electrical Characteristics of the β-Ga₂O₃ JFET by Using Nitrogen Doping
J Electr Electron Mater. 2025;38(2):207-212.   Published online March 1, 2025
Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.

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Analysis of the Electrical Characteristics of the β-Ga₂O₃ JFET by Using Nitrogen Doping
J Electr Electron Mater. 2025;38(2):207-212.   Published online March 1, 2025
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