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"Pseudo-MOSFET"

Carrier Lifetime Analysis of Proton Irradiated SOI Wafer with Pseudo MOSFET Technology
Sung Hoon Jung, Yong Hyun Lee, Jae Sung Lee, Young Kyu Kwon, Young Ho Bae
J Korean Inst Electr Electron Mater Eng 2009;22(9):732-736.   Published online September 1, 2009
DOI: https://doi.org/10.4313/JKEM.2009.22.9.732
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