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SILVACO
WHERE t1.sid in(parameter_dbtbl_keyword '%SILVACO%') and t1.xml_status <> 99
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"SILVACO"
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JFET (2)
Junction (2)
SiGe (2)
SILVACO (2)
Capacitance (1)
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2009 (2)
2008 (1)
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C. J. Choi (2)
B. G. Park (2)
K. H. Shim (2)
H. D. Yang (2)
Dae Hyung Cho (1)
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Keywords
JFET (2)
Junction (2)
SiGe (2)
SILVACO (2)
Capacitance (1)
Diffusion (1)
Interface states (1)
MOS (1)
Plasma-induced etch damage (1)
Si (1)
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authors
C. J. Choi (2)
B. G. Park (2)
K. H. Shim (2)
H. D. Yang (2)
Dae Hyung Cho (1)
Won Ju Cho (1)
Hong Bay Chung (1)
Yeong Deuk Jo (1)
Ji Hong Kim (1)
J. Y. Kim (1)
Sang Mo Koo (1)
Byung Moo Moon (1)
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2008 (1)
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"SILVACO"
Comparison Study on Electrical Properties of SiGe JFET and Si JFET
B. G. Park, H. D. Yang, C. J. Choi, K. H. Shim
J Korean Inst Electr Electron Mater Eng
2009;22(11):910-917.
Published online November 1, 2009
DOI:
https://doi.org/10.4313/JKEM.2009.22.11.910
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Electrical Properties of JFET using SiGe/Si/SiGe Channel Structure
B. G. Park, H. D. Yang, C. J. Choi, J. Y. Kim, K. H. Shim
J Korean Inst Electr Electron Mater Eng
2009;22(11):905-909.
Published online November 1, 2009
DOI:
https://doi.org/10.4313/JKEM.2009.22.11.905
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76
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C-V Characterization of Plasma Etch-damage Effect on (100) SOI
Yeong Deuk Jo, Ji Hong Kim, Dae Hyung Cho, Byung Moo Moon, Won Ju Cho, Hong Bay Chung, Sang Mo Koo
J Korean Inst Electr Electron Mater Eng
2008;21(8):711-714.
Published online August 1, 2008
DOI:
https://doi.org/10.4313/JKEM.2008.21.8.711
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72
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